dc.contributor.author | Van der Plas, Geert | |
dc.contributor.author | Thijs, Steven | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Katti, Guruprasad | |
dc.contributor.author | Limaye, Paresh | |
dc.contributor.author | Mercha, Abdelkarim | |
dc.contributor.author | Stucchi, Michele | |
dc.contributor.author | Oprins, Herman | |
dc.contributor.author | Vandevelde, Bart | |
dc.contributor.author | Minas, Nikolaos | |
dc.contributor.author | Cupak, Miroslav | |
dc.contributor.author | Dehan, Morin | |
dc.contributor.author | Nelis, Marc | |
dc.contributor.author | Agarwal, Rahul | |
dc.contributor.author | Dehaene, Wim | |
dc.contributor.author | Travaly, Youssef | |
dc.contributor.author | Beyne, Eric | |
dc.contributor.author | Marchal, Pol | |
dc.date.accessioned | 2021-10-18T22:58:14Z | |
dc.date.available | 2021-10-18T22:58:14Z | |
dc.date.issued | 2010-09 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18168 | |
dc.source | IIOimport | |
dc.title | Verifying electrical/thermal/thermo-mechanical behavior of a 3D stack – challenges and solutions | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Van der Plas, Geert | |
dc.contributor.imecauthor | Thijs, Steven | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Mercha, Abdelkarim | |
dc.contributor.imecauthor | Stucchi, Michele | |
dc.contributor.imecauthor | Oprins, Herman | |
dc.contributor.imecauthor | Vandevelde, Bart | |
dc.contributor.imecauthor | Cupak, Miroslav | |
dc.contributor.imecauthor | Dehaene, Wim | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Van der Plas, Geert::0000-0002-4975-6672 | |
dc.contributor.orcidimec | Thijs, Steven::0000-0003-2889-8345 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Mercha, Abdelkarim::0000-0002-2174-6958 | |
dc.contributor.orcidimec | Oprins, Herman::0000-0003-0680-4969 | |
dc.contributor.orcidimec | Vandevelde, Bart::0000-0002-6753-6438 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1 | |
dc.source.endpage | 4 | |
dc.source.conference | IEEE Custom Integrated Circuits Conference - CICC | |
dc.source.conferencedate | 19/09/2010 | |
dc.source.conferencelocation | San Jose, CA US | |
imec.availability | Published - imec | |