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Charge pumping of single interface traps in submicron MOSFET's

dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorBellens, Rudi
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-29T12:41:48Z
dc.date.available2021-09-29T12:41:48Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/181
dc.sourceIIOimport
dc.titleCharge pumping of single interface traps in submicron MOSFET's
dc.typeProceedings paper
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDe Wolf, Ingrid
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage609
dc.source.endpage612
dc.source.conference24th European Solid State Device Research Conference - ESSDERC
dc.source.conferencedate11/09/1994
dc.source.conferencelocationEdinburgh UK
imec.availabilityPublished - open access


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