dc.contributor.author | Vanstreels, Kris | |
dc.contributor.author | Okoro, Chukwudi | |
dc.contributor.author | Labie, Riet | |
dc.date.accessioned | 2021-10-18T23:32:51Z | |
dc.date.available | 2021-10-18T23:32:51Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18242 | |
dc.source | IIOimport | |
dc.title | Mechanical and thermo-mechanical behavior of electroplated Copper Through Silicon Vias | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Vanstreels, Kris | |
dc.contributor.imecauthor | Labie, Riet | |
dc.contributor.orcidimec | Vanstreels, Kris::0000-0002-4420-0966 | |
dc.contributor.orcidimec | Labie, Riet::0000-0002-1401-1291 | |
dc.source.peerreview | no | |
dc.source.conference | Nanomeasure Symposium | |
dc.source.conferencedate | 3/06/2010 | |
dc.source.conferencelocation | Krakow Poland | |
imec.availability | Published - imec | |