dc.contributor.author | Verbree, Jouke | |
dc.contributor.author | Marinissen, Erik Jan | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Velenis, Dimitrios | |
dc.date.accessioned | 2021-10-18T23:39:25Z | |
dc.date.available | 2021-10-18T23:39:25Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18256 | |
dc.source | IIOimport | |
dc.title | On the cost-effectiveness of matching repositories of pre-tested wafers for wafer-to-wafer 3D chip stacking | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Velenis, Dimitrios | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 36 | |
dc.source.endpage | 41 | |
dc.source.conference | 15th IEEE European Test Symposium - ETS | |
dc.source.conferencedate | 24/05/2010 | |
dc.source.conferencelocation | Prague Czech Republic | |
dc.identifier.url | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5512785 | |
imec.availability | Published - open access | |