Show simple item record

Characterization of nickel-silicides by HAADF-STEM imaging

dc.contributor.authorVerleysen, Eveline
dc.contributor.authorBender, Hugo
dc.contributor.authorRichard, Olivier
dc.contributor.authorSchryvers, Dominique
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-18T23:49:22Z
dc.date.available2021-10-18T23:49:22Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18277
dc.sourceIIOimport
dc.titleCharacterization of nickel-silicides by HAADF-STEM imaging
dc.typeProceedings paper
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.source.peerreviewyes
dc.source.conferenceInternational Microscopy Congress - IMC-17
dc.source.conferencedate19/09/2010
dc.source.conferencelocationRio de Janeiro Brazil
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record