Show simple item record

Characterization of nickel silicides using EELS-based methods

dc.contributor.authorVerleysen, Eveline
dc.contributor.authorBender, Hugo
dc.contributor.authorRichard, Olivier
dc.contributor.authorSchryvers, Dominique
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-18T23:50:22Z
dc.date.available2021-10-18T23:50:22Z
dc.date.issued2010
dc.identifier.issn1365-2818
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18279
dc.sourceIIOimport
dc.titleCharacterization of nickel silicides using EELS-based methods
dc.typeJournal article
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.identifier.doi10.1111/j.1365-2818.2010.03391.x
dc.source.peerreviewno
dc.source.beginpage75
dc.source.endpage82
dc.source.journalJournal of Microscopy
dc.source.issue1
dc.source.volume240
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record