dc.contributor.author | De Wolf, Ingrid | |
dc.contributor.author | Howard, Dave | |
dc.contributor.author | Rasras, Mahmoud | |
dc.contributor.author | Lauwers, A. | |
dc.contributor.author | Maex, Karen | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Maes, Herman | |
dc.date.accessioned | 2021-09-30T08:08:01Z | |
dc.date.available | 2021-09-30T08:08:01Z | |
dc.date.issued | 1997 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1828 | |
dc.source | IIOimport | |
dc.title | A reliability study of titanium silicide lines using micro-Raman spectroscopy and electron microscopy | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | De Wolf, Ingrid | |
dc.contributor.imecauthor | Maex, Karen | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 1591 | |
dc.source.endpage | 1594 | |
dc.source.conference | Proceedings of 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 97; October 1997. | |
dc.source.conferencelocation | | |
imec.availability | Published - open access | |