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Ultimate Ge passivation: process and materials characterization of ultrathin Si cap layers grown on Ge substrates
Publication:
Ultimate Ge passivation: process and materials characterization of ultrathin Si cap layers grown on Ge substrates
Date
2010
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vincent, Benjamin
;
Caymax, Matty
;
Vandervorst, Wilfried
;
Valev, Ventislav
;
Verbiest, Thierry
;
Loo, Roger
Journal
Abstract
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Views
1970
since deposited on 2021-10-19
Acq. date: 2025-10-27
Citations
Metrics
Views
1970
since deposited on 2021-10-19
Acq. date: 2025-10-27
Citations