Applicable solvent photoresist strip process for high-k/metal gate
dc.contributor.author | Wada, M | |
dc.contributor.author | Takahashi, H | |
dc.contributor.author | Snow, J | |
dc.contributor.author | Vos, Rita | |
dc.contributor.author | Mertens, PW | |
dc.contributor.author | Shirakawa, H | |
dc.date.accessioned | 2021-10-19T00:11:25Z | |
dc.date.available | 2021-10-19T00:11:25Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18321 | |
dc.source | IIOimport | |
dc.title | Applicable solvent photoresist strip process for high-k/metal gate | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Vos, Rita | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 78 | |
dc.source.endpage | 79 | |
dc.source.conference | 10th International Symposium on Ultra-Clean Processing of Semiconductor Devices - UCPSS | |
dc.source.conferencedate | 20/09/2010 | |
dc.source.conferencelocation | Oostende Belgium | |
imec.availability | Published - open access | |
imec.internalnotes | Paper 6.6 |