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Source-pull characterization of FinFET noise

dc.contributor.authorWiatr, W.
dc.contributor.authorCrupi, G.
dc.contributor.authorCaddemi, A.
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorSchreurs, Dominique
dc.date.accessioned2021-10-19T00:24:52Z
dc.date.available2021-10-19T00:24:52Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18348
dc.sourceIIOimport
dc.titleSource-pull characterization of FinFET noise
dc.typeProceedings paper
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.source.peerreviewno
dc.source.beginpage425
dc.source.endpage430
dc.source.conference17th International Conference on Mixed Design of Integrated Circuits and Systems - MIXDES
dc.source.conferencedate26/06/2010
dc.source.conferencelocationWarsaw Poland
imec.availabilityPublished - imec


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