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The effect of externally imposed mechanical stress on the hot-carrier-induced degradation of deep-sub micron nMOSFET's

dc.contributor.authorDegraeve, Robin
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-30T08:09:45Z
dc.date.available2021-09-30T08:09:45Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1839
dc.sourceIIOimport
dc.titleThe effect of externally imposed mechanical stress on the hot-carrier-induced degradation of deep-sub micron nMOSFET's
dc.typeJournal article
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDe Wolf, Ingrid
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage943
dc.source.endpage950
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue6
dc.source.volume44
imec.availabilityPublished - open access


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