Publication:
The effect of externally imposed mechanical stress on the hot-carrier-induced degradation of deep-sub micron nMOSFET's
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1823 since deposited on 2021-09-30
1last month
Acq. date: 2026-01-10
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Views
1823 since deposited on 2021-09-30
1last month
Acq. date: 2026-01-10
Citations