The effect of externally imposed mechanical stress on the hot-carrier-induced degradation of deep-sub micron nMOSFET's

dc.contributor.author	Degraeve, Robin
dc.contributor.author	Groeseneken, Guido
dc.contributor.author	De Wolf, Ingrid
dc.contributor.author	Maes, Herman
dc.contributor.imecauthor	Degraeve, Robin
dc.contributor.imecauthor	Groeseneken, Guido
dc.contributor.imecauthor	De Wolf, Ingrid
dc.date.accessioned	2021-09-30T08:09:45Z
dc.date.available	2021-09-30T08:09:45Z
dc.date.embargo	9999-12-31
dc.date.issued	1997
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/1839
dc.source.beginpage	943
dc.source.endpage	950
dc.source.issue	6
dc.source.journal	IEEE Transactions on Electron Devices
dc.source.volume	44
dc.title	The effect of externally imposed mechanical stress on the hot-carrier-induced degradation of deep-sub micron nMOSFET's
dc.type	Journal article
dspace.entity.type	Publication
Files	Original bundle Name: 1811.pdf Size: 252.71 KB Format: Adobe Portable Document Format Download
Publication available in collections:	Articles