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Low temperature operation as a tool to investigate second order effects in submicron MOSFET's

dc.contributor.authorGutierrez, Edmundo
dc.contributor.authorDeferm, Ludo
dc.date.accessioned2021-09-29T12:41:50Z
dc.date.available2021-09-29T12:41:50Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/183
dc.sourceIIOimport
dc.titleLow temperature operation as a tool to investigate second order effects in submicron MOSFET's
dc.typeProceedings paper
dc.contributor.imecauthorDeferm, Ludo
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage159
dc.source.endpage162
dc.source.conference24th European Solid State Device Research Conference - ESSDERC
dc.source.conferencedate11/09/1994
dc.source.conferencelocationEdinburgh UK
imec.availabilityPublished - open access


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