Authors

Zahid, Mohammed; Arreghini, Antonio; Degraeve, Robin; Govoreanu, Bogdan; Suhane, Amit; Van Houdt, Jan

ISSN

0741-3106

Issue

10

Journal

IEEE Electron Device Letters

Volume

31

Title

Electron trap profiling near Al2O3/ gate interface in TANOS stack using gate-side-trap spectroscopy by charge injection and sensing

Publication type

Journal article