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Statistical SRAM analysis for yield enhancement

dc.contributor.authorZuber, Paul
dc.contributor.authorMiranda Corbalan, Miguel
dc.contributor.authorDobrovolny, Petr
dc.contributor.authorvan der Zanden, Koen
dc.contributor.authorJung, Jong-Hoon
dc.date.accessioned2021-10-19T01:08:46Z
dc.date.available2021-10-19T01:08:46Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18435
dc.sourceIIOimport
dc.titleStatistical SRAM analysis for yield enhancement
dc.typeProceedings paper
dc.contributor.imecauthorZuber, Paul
dc.contributor.imecauthorDobrovolny, Petr
dc.contributor.orcidimecDobrovolny, Petr::0000-0002-1465-481X
dc.source.peerreviewyes
dc.source.beginpage57
dc.source.endpage62
dc.source.conferenceDesign, Automation and Test in Europe Conference - DATE
dc.source.conferencedate8/03/2010
dc.source.conferencelocationDresden Germany
imec.availabilityPublished - imec


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