Publication:

On the impact of the edge profile of interconnects on the occurrence of passivation cracks of plastic-encapsulated electronic power devices

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

2045 since deposited on 2021-10-19
1last month
Acq. date: 2026-01-07

Citations

Metrics

Views

2045 since deposited on 2021-10-19
1last month
Acq. date: 2026-01-07

Citations