Show simple item record

Global and/or local strain influence on p and n MuGFET analog performance

dc.contributor.authorAgopian, P.G.D.
dc.contributor.authorMartino, J.A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-19T12:28:36Z
dc.date.available2021-10-19T12:28:36Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18459
dc.sourceIIOimport
dc.titleGlobal and/or local strain influence on p and n MuGFET analog performance
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage154
dc.source.endpage150
dc.source.conferenceAdvanced Semiconductor-on-Insulator Technology and Related Physics 15
dc.source.conferencedate1/05/2011
dc.source.conferencelocationMontreal Canada
imec.availabilityPublished - open access
imec.internalnotesECS Transactions; Vol. 35; Ias. 5


Files in this item

Thumbnail
Name:
23044.pdf
Size:
66.63Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record