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Analysis of UTBOX-1T DRAM memory cell at high temperatures

dc.contributor.authorAlmeida, L.M.
dc.contributor.authorSasaki, K.R.A.
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-19T12:28:51Z
dc.date.available2021-10-19T12:28:51Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18469
dc.sourceIIOimport
dc.titleAnalysis of UTBOX-1T DRAM memory cell at high temperatures
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage53
dc.source.endpage60
dc.source.conference26th Symposium on Microelectronics Technology and Devices - SBMicro
dc.source.conferencedate30/08/2011
dc.source.conferencelocationJoao Pessoa Brazil
imec.availabilityPublished - imec
imec.internalnotesECS Transactions; Vol. 39, Issue 1


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