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Simulation of disturbs during read and program operations in vertical flash devices

dc.contributor.authorArreghini, Antonio
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-19T12:29:42Z
dc.date.available2021-10-19T12:29:42Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18491
dc.sourceIIOimport
dc.titleSimulation of disturbs during read and program operations in vertical flash devices
dc.typeProceedings paper
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewyes
dc.source.conferenceInternational Workshop on Simulation and Modeling of Memory devices - IWSM2
dc.source.conferencedate6/10/2011
dc.source.conferencelocationAgrate Brianza Italy
imec.availabilityPublished - imec


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