Show simple item record

FIB/SEM structural analysis of through-silicon-vias

dc.contributor.authorBender, Hugo
dc.contributor.authorDrijbooms, Chris
dc.contributor.authorRadisic, Alex
dc.date.accessioned2021-10-19T12:33:18Z
dc.date.available2021-10-19T12:33:18Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18550
dc.sourceIIOimport
dc.titleFIB/SEM structural analysis of through-silicon-vias
dc.typeOral presentation
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorDrijbooms, Chris
dc.contributor.imecauthorRadisic, Alex
dc.source.peerreviewno
dc.source.conferenceEuropean FIB User Group Meeting
dc.source.conferencedate3/10/2011
dc.source.conferencelocationBordeaux France
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record