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Characterisation of 2% mismatched InGaAs and InAsP layers, grown on different buffer layers and at different growth temperatures
Publication:
Characterisation of 2% mismatched InGaAs and InAsP layers, grown on different buffer layers and at different growth temperatures
Date
1997
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
D'Hondt, Mark
;
Moerman, Ingrid
;
Demeester, Piet
Journal
Journal of Crystal Growth
Abstract
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1885
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations
Metrics
Views
1885
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations