Electrical quality of III-V/oxide interfaces: good enough for MOSFET devices?

Thumbnail
View/open
Metadata
Show full item record
Authors
Brammertz, Guy; Alian, AliReza; Lin, Dennis; Nyns, Laura; Sioncke, Sonja; Merckling, Clement; Wang, Wei-E; Caymax, Matty; Hoffmann, Thomas Y.
Conference
China Semiconductor Technology International Conference - CSTIC
Title
Electrical quality of III-V/oxide interfaces: good enough for MOSFET devices?
Publication type
Proceedings paper
Embargo date
9999-12-31
Collections