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Nanoelectronics and More-than-Moore at IMEC

dc.contributor.authorCartuyvels, Rudi
dc.contributor.authorBiesemans, Serge
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorDe Boeck, Jo
dc.date.accessioned2021-10-19T12:42:35Z
dc.date.available2021-10-19T12:42:35Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18643
dc.sourceIIOimport
dc.titleNanoelectronics and More-than-Moore at IMEC
dc.typeProceedings paper
dc.contributor.imecauthorCartuyvels, Rudi
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorDe Boeck, Jo
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage24
dc.source.endpage30
dc.source.conferenceFrontiers of Characterization and Metrology for Nanoelectronics
dc.source.conferencedate23/05/2011
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - open access
imec.internalnotesAIP Conference Proceedings; Vol. 1395


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