dc.contributor.author | Chen, J. | |
dc.contributor.author | Cornagliotti, Emanuele | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Hieckmann, E. | |
dc.contributor.author | Weber, J. | |
dc.contributor.author | Poortmans, Jef | |
dc.date.accessioned | 2021-10-19T12:44:16Z | |
dc.date.available | 2021-10-19T12:44:16Z | |
dc.date.issued | 2011 | |
dc.identifier.issn | 1862-6254 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18657 | |
dc.source | IIOimport | |
dc.title | A deep level transient spectroscopy study on the interface states across grain boundaries in multicrystalline silicon | |
dc.type | Journal article | |
dc.contributor.imecauthor | Cornagliotti, Emanuele | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Poortmans, Jef | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 277 | |
dc.source.endpage | 279 | |
dc.source.journal | Physica Status Solidi. Rapid Research Letters | |
dc.source.issue | 8 | |
dc.source.volume | 5 | |
imec.availability | Published - open access | |