dc.contributor.author | Chen, Jiahe | |
dc.contributor.author | Cornagliotti, Emanuele | |
dc.contributor.author | Hieckmann, E. | |
dc.contributor.author | Berendt, S. | |
dc.contributor.author | Weber, J. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Poortmans, Jef | |
dc.date.accessioned | 2021-10-19T12:44:25Z | |
dc.date.available | 2021-10-19T12:44:25Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18658 | |
dc.source | IIOimport | |
dc.title | On the electrical characterization of grain boundaries in multicrytalline silicon | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Cornagliotti, Emanuele | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Poortmans, Jef | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 71 | |
dc.source.endpage | 80 | |
dc.source.conference | Photovoltaics for the 21st Century 6 | |
dc.source.conferencedate | 10/10/2010 | |
dc.source.conferencelocation | Las Vegas, NV USA | |
imec.availability | Published - open access | |
imec.internalnotes | ECS Transactions; Vol. 33; Issue 17 | |