Show simple item record

Electrical properties along grain boundaries in multicrystalline silicon measured by capacitance technique

dc.contributor.authorChen, Jimmy
dc.contributor.authorSimoen, Eddy
dc.contributor.authorCornagliotti, Emanuele
dc.contributor.authorHieckmann, E.
dc.contributor.authorWeber, J.
dc.contributor.authorPoortmans, Jef
dc.date.accessioned2021-10-19T12:44:50Z
dc.date.available2021-10-19T12:44:50Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18661
dc.sourceIIOimport
dc.titleElectrical properties along grain boundaries in multicrystalline silicon measured by capacitance technique
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorCornagliotti, Emanuele
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewno
dc.source.conferenceE-MRS Spring Meeting Symposium R: Advanced Inorganic Materials and Concepts for Photovoltaics
dc.source.conferencedate9/05/2011
dc.source.conferencelocationNice France
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record