| dc.contributor.author | Dreesen, R. | |
| dc.contributor.author | De Ceuninck, Ward | |
| dc.contributor.author | De Schepper, Luc | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.date.accessioned | 2021-09-30T08:14:49Z | |
| dc.date.available | 2021-09-30T08:14:49Z | |
| dc.date.issued | 1997 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1871 | |
| dc.source | IIOimport | |
| dc.title | A high resolution method for measuring hot carrier degradation in matched transistor pairs | |
| dc.type | Journal article | |
| dc.contributor.imecauthor | De Ceuninck, Ward | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.embargo | 9999-12-31 | |
| dc.source.peerreview | no | |
| dc.source.beginpage | 1533 | |
| dc.source.endpage | 1536 | |
| dc.source.journal | Microelectronics and Reliability | |
| dc.source.issue | 10_11 | |
| dc.source.volume | 37 | |
| imec.availability | Published - open access | |
| imec.internalnotes | Special Issue 8th European Sympoaium on Electron Devices, Failure Physics and Analysis (ESREF 97) | |
