A high resolution method for measuring hot carrier degradation in matched transistor pairs

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Authors

Dreesen, R.; De Ceuninck, Ward; De Schepper, Luc; Groeseneken, Guido

Issue

10_11

Journal

Microelectronics and Reliability

Volume

37

Title

A high resolution method for measuring hot carrier degradation in matched transistor pairs

Publication type

Journal article

Embargo date

9999-12-31

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