A high resolution method for measuring hot carrier degradation in matched transistor pairs

dc.contributor.author	Dreesen, R.
dc.contributor.author	De Ceuninck, Ward
dc.contributor.author	De Schepper, Luc
dc.contributor.author	Groeseneken, Guido
dc.contributor.imecauthor	De Ceuninck, Ward
dc.contributor.imecauthor	Groeseneken, Guido
dc.date.accessioned	2021-09-30T08:14:49Z
dc.date.available	2021-09-30T08:14:49Z
dc.date.embargo	9999-12-31
dc.date.issued	1997
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/1871
dc.source.beginpage	1533
dc.source.endpage	1536
dc.source.issue	10_11
dc.source.journal	Microelectronics and Reliability
dc.source.volume	37
dc.title	A high resolution method for measuring hot carrier degradation in matched transistor pairs
dc.type	Journal article
dspace.entity.type	Publication
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