dc.contributor.author | Dam, Van Anh | |
dc.contributor.author | Blauw, Michiel | |
dc.contributor.author | Brongersma, Sywert | |
dc.contributor.author | Crego Calama, Mercedes | |
dc.date.accessioned | 2021-10-19T13:00:54Z | |
dc.date.available | 2021-10-19T13:00:54Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18763 | |
dc.source | IIOimport | |
dc.title | Sensitivity enhancement of metal oxide thin film transistor with back gate biasing | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Dam, Van Anh | |
dc.contributor.imecauthor | Brongersma, Sywert | |
dc.contributor.orcidimec | Brongersma, Sywert::0000-0002-1755-3897 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 112 | |
dc.source.endpage | 115 | |
dc.source.conference | Eurosensors XXV | |
dc.source.conferencedate | 4/09/2011 | |
dc.source.conferencelocation | Athens Greece | |
imec.availability | Published - open access | |
imec.internalnotes | Procedia Engineering; Vol. 25(2011) | |