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Raman spectroscopy based stress testing: A critical review

dc.contributor.authorDe Wolf, Ingrid
dc.date.accessioned2021-10-19T13:09:42Z
dc.date.available2021-10-19T13:09:42Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18810
dc.sourceIIOimport
dc.titleRaman spectroscopy based stress testing: A critical review
dc.typeMeeting abstract
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.source.peerreviewno
dc.source.conference4. Fachkongress MicroCar: Mikro- und Nananowerkstoffe fur Automobilelektronik
dc.source.conferencedate1/03/2011
dc.source.conferencelocationLeipzig Germany
imec.availabilityPublished - imec


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