Show simple item record

Deterministic and stochastic component in RESET transient of HfSiO/FUSI gate RRAM stack

dc.contributor.authorDegraeve, Robin
dc.contributor.authorGoux, Ludovic
dc.contributor.authorRoussel, Philippe
dc.contributor.authorWouters, Dirk
dc.contributor.authorKittl, Jorge
dc.contributor.authorAltimime, Laith
dc.contributor.authorJurczak, Gosia
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-19T13:11:28Z
dc.date.available2021-10-19T13:11:28Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18819
dc.sourceIIOimport
dc.titleDeterministic and stochastic component in RESET transient of HfSiO/FUSI gate RRAM stack
dc.typeProceedings paper
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage28
dc.source.endpage30
dc.source.conferenceSymposium on VLSI Technology
dc.source.conferencedate13/06/2011
dc.source.conferencelocationJapan Kyoto
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
22324.pdf
Size:
361.0Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record