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Automation of 3D DfT insertion and interconnect test generation

dc.contributor.authorDeutsch, Sergej
dc.contributor.authorChickermane, Vivek
dc.contributor.authorKeller, Brion
dc.contributor.authorKonijnenburg, Mario
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorGoel, Sandeep K.
dc.date.accessioned2021-10-19T13:14:52Z
dc.date.available2021-10-19T13:14:52Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18835
dc.sourceIIOimport
dc.titleAutomation of 3D DfT insertion and interconnect test generation
dc.typeOral presentation
dc.contributor.imecauthorKonijnenburg, Mario
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecKonijnenburg, Mario::0000-0001-8016-0888
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewno
dc.source.conferenceIEEE International Test Conference - ITC
dc.source.conferencedate18/09/2011
dc.source.conferencelocationAnaheim, CA USA
imec.availabilityPublished - imec


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