dc.contributor.author | Deutsch, Sergej | |
dc.contributor.author | Chickermane, Vivek | |
dc.contributor.author | Keller, Brion | |
dc.contributor.author | Mukherjee, Subhasish | |
dc.contributor.author | Konijnenburg, Mario | |
dc.contributor.author | Marinissen, Erik Jan | |
dc.contributor.author | Goel, Sandeep K. | |
dc.date.accessioned | 2021-10-19T13:15:19Z | |
dc.date.available | 2021-10-19T13:15:19Z | |
dc.date.issued | 2011-09 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18837 | |
dc.source | IIOimport | |
dc.title | Automation of 3D-DfT insertion | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Konijnenburg, Mario | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.orcidimec | Konijnenburg, Mario::0000-0001-8016-0888 | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Workshop on Testing Three-Dimensional Stacked ICs- 3D-TEST | |
dc.source.conferencedate | 22/09/2011 | |
dc.source.conferencelocation | Anaheim, CA USA | |
imec.availability | Published - imec | |