dc.contributor.author | Dietze, Uwe | |
dc.contributor.author | Dress, Peter | |
dc.contributor.author | Waehler, Tobias | |
dc.contributor.author | Singh, Sherjang | |
dc.contributor.author | Jonckheere, Rik | |
dc.contributor.author | Baudemprez, Bart | |
dc.date.accessioned | 2021-10-19T13:16:59Z | |
dc.date.available | 2021-10-19T13:16:59Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18845 | |
dc.source | IIOimport | |
dc.title | Effective EUVL mask cleaning technology solutions for mask manufacturing and in-fab mask maintenance | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Jonckheere, Rik | |
dc.contributor.imecauthor | Baudemprez, Bart | |
dc.contributor.orcidimec | Jonckheere, Rik::0000-0003-2211-9443 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 79850N | |
dc.source.conference | 27th European Mask and Lithography Conference - EMLC | |
dc.source.conferencedate | 18/01/2011 | |
dc.source.conferencelocation | Dresden Germany | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings SPIE, Vol.7985 | |