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dc.contributor.authorEl-Mamouni, F.
dc.contributor.authorZhang, E.X.
dc.contributor.authorHooten, N.
dc.contributor.authorSchrimpf, R.D.
dc.contributor.authorReed, R.
dc.contributor.authorGalloway, K.F.
dc.contributor.authorMcMarrow, D.
dc.contributor.authorWarner, J.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-19T13:23:39Z
dc.date.available2021-10-19T13:23:39Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18875
dc.sourceIIOimport
dc.titleLaser-induced current transients in bulk FinFETs
dc.typeMeeting abstract
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conferenceNuclear and Space Radiation Engineering Conference - NSREC
dc.source.conferencedate25/07/2011
dc.source.conferencelocationLas Vegas USA
imec.availabilityPublished - imec


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