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Noncontact metrology for inversion charge carrier mobility by corona charge and photovoltage measurements on blank wafers with a gate dielectric
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Authors
Everaert, Jean-Luc
;
Rosseel, Erik
;
Pap, Aron
;
Meszaros, Albert
;
Dekoster, Johan
;
Pavelka, Tibor
ISSN
1071-1023
Issue
1
Journal
Journal of Vacuum Science and Technology B
Volume
29
Title
Noncontact metrology for inversion charge carrier mobility by corona charge and photovoltage measurements on blank wafers with a gate dielectric
Publication type
Journal article
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