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Two-dimensional analysis of Al and B back surface field using scanning

dc.contributor.authorEyben, Pierre
dc.contributor.authorWerner, Thilo
dc.contributor.authorHantschel, Thomas
dc.contributor.authorSchulze, Andreas
dc.contributor.authorLorenz, Anne
dc.contributor.authorJohn, Joachim
dc.contributor.authorHorzel, Jörg
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-19T13:28:10Z
dc.date.available2021-10-19T13:28:10Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18893
dc.sourceIIOimport
dc.titleTwo-dimensional analysis of Al and B back surface field using scanning
dc.typeProceedings paper
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorJohn, Joachim
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.source.peerreviewno
dc.source.conference2nd Intl Workshop for SPM for Energy Applications
dc.source.conferencedate8/06/2011
dc.source.conferencelocationMainz Germany
imec.availabilityPublished - imec


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