Single-electron capacitance spectroscopy of individual dopants in silicon

View/open

Not Applicable (or Unknown) (713.4Kb)

23073.pdf (2.060Mb)

Metadata

Show full item record

Authors

Gasseller, M.; DeNinno, M.; Loo, Roger; Harrison, J.F; Caymax, Matty; Rogge, S.; Tessmer, S.H.

DOI

10.1021/nl2025163

ISSN

1530-6984

Issue

12

Journal

Nano Letters

Volume

11

Title

Single-electron capacitance spectroscopy of individual dopants in silicon

Publication type

Journal article

Embargo date

9999-12-31

Collections

Articles