Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Single-electron capacitance spectroscopy of individual dopants in silicon
Publication:
Single-electron capacitance spectroscopy of individual dopants in silicon
Date
2011-10
Journal article
https://doi.org/10.1021/nl2025163
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
Single-electron_capacitance_spectroscopy_of_individual_dopants_in_silicon
713.43 KB
23073.pdf
2.06 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gasseller, M.
;
DeNinno, M.
;
Loo, Roger
;
Harrison, J.F
;
Caymax, Matty
;
Rogge, S.
;
Tessmer, S.H.
Journal
Nano Letters
Abstract
Description
Metrics
Downloads
171
since deposited on 2021-10-19
Acq. date: 2025-10-23
Views
1884
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Downloads
171
since deposited on 2021-10-19
Acq. date: 2025-10-23
Views
1884
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations