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Advanced modeling of oxide defects for random telegraph noise

dc.contributor.authorGoes, Wolfgang
dc.contributor.authorSchanovsky, Franz
dc.contributor.authorGrasser, Tibor
dc.contributor.authorReisinger, Hans
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-19T13:47:00Z
dc.date.available2021-10-19T13:47:00Z
dc.date.issued2011-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18966
dc.sourceIIOimport
dc.titleAdvanced modeling of oxide defects for random telegraph noise
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage204
dc.source.endpage207
dc.source.conference21st International Conference on Noise and Fluctuations - ICNF
dc.source.conferencedate12/06/2011
dc.source.conferencelocationToronto, ONT Canada
imec.availabilityPublished - open access


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