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Experimental demonstration of high TM reflectivity in GaAs based GIRO-gratings in the wavelength region of 9-11μm

dc.contributor.authorGoeman, Stefan
dc.contributor.authorDhoedt, Bart
dc.contributor.authorCaekebeke, Kristien
dc.contributor.authorVerstuyft, Steven
dc.contributor.authorBaets, Roel
dc.contributor.authorVan Daele, Peter
dc.contributor.authorNieuborg, N.
dc.contributor.authorPanajotov, K.
dc.contributor.authorThienpont, H.
dc.date.accessioned2021-09-30T08:19:26Z
dc.date.available2021-09-30T08:19:26Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1896
dc.sourceIIOimport
dc.titleExperimental demonstration of high TM reflectivity in GaAs based GIRO-gratings in the wavelength region of 9-11μm
dc.typeProceedings paper
dc.contributor.imecauthorDhoedt, Bart
dc.contributor.imecauthorVerstuyft, Steven
dc.contributor.imecauthorBaets, Roel
dc.contributor.imecauthorVan Daele, Peter
dc.contributor.orcidimecDhoedt, Bart::0000-0002-7271-7479
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.contributor.orcidimecVan Daele, Peter::0000-0003-0557-7741
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage13
dc.source.endpage14
dc.source.conference10th Annual Meeting IEEE Lasers and Electro-Optics Society - LEOS
dc.source.conferencedate10/11/1997
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - imec


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