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A fast and reliable method used to investigate the size-dependent retention lifetime of a phase-change line cell
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Authors
Goux, Ludovic
;
Hurkx, Fred
;
Wang, Xin Peng
;
Delhougne, Romain
;
Attenborough, Karen
;
Gravesteijn, Dirk
;
Wouters, Dirk
;
Perez Gonzalez, Jesus
ISSN
0038-1101
Issue
1
Journal
Solid-State Electronics
Volume
58
Title
A fast and reliable method used to investigate the size-dependent retention lifetime of a phase-change line cell
Publication type
Journal article
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