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A fast and reliable method used to investigate the size-dependent retention lifetime of a phase-change line cell

dc.contributor.authorGoux, Ludovic
dc.contributor.authorHurkx, Fred
dc.contributor.authorWang, Xin Peng
dc.contributor.authorDelhougne, Romain
dc.contributor.authorAttenborough, Karen
dc.contributor.authorGravesteijn, Dirk
dc.contributor.authorWouters, Dirk
dc.contributor.authorPerez Gonzalez, Jesus
dc.date.accessioned2021-10-19T13:53:27Z
dc.date.available2021-10-19T13:53:27Z
dc.date.issued2011
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18990
dc.sourceIIOimport
dc.titleA fast and reliable method used to investigate the size-dependent retention lifetime of a phase-change line cell
dc.typeJournal article
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.source.peerreviewyes
dc.source.beginpage17
dc.source.endpage22
dc.source.journalSolid-State Electronics
dc.source.issue1
dc.source.volume58
dc.identifier.urlhttp://authors.elsevier.com/offprints/SSE5669/ca41e412e59a63c6276880a829b3be48
imec.availabilityPublished - imec


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