Show simple item record

The paradigm shift in understanding the bias temperature instability: from reaction–diffusion to switching oxide traps

dc.contributor.authorGrasser, Tibor
dc.contributor.authorKaczer, Ben
dc.contributor.authorGoes, Wolfgang
dc.contributor.authorReisinger, Hans
dc.contributor.authorAichinger, Thomas
dc.contributor.authorHehenberger, Phillip
dc.contributor.authorWagner, Paul-Jurgen
dc.contributor.authorSchanovsky, Franz
dc.contributor.authorFranco, Jacopo
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorNelhiebel, M
dc.date.accessioned2021-10-19T13:56:54Z
dc.date.available2021-10-19T13:56:54Z
dc.date.issued2011
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19000
dc.sourceIIOimport
dc.titleThe paradigm shift in understanding the bias temperature instability: from reaction–diffusion to switching oxide traps
dc.typeJournal article
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage3652
dc.source.endpage3666
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue11
dc.source.volume58
dc.identifier.urlhttp://dx.doi.org/10.1109/TED.2011.2164543
imec.availabilityPublished - imec


Files in this item

Thumbnail
Name:
23751.pdf
Size:
2.353Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record