Authors

Grasser, Tibor; Kaczer, Ben; Goes, Wolfgang; Reisinger, Hans; Aichinger, Thomas; Hehenberger, Phillip; Wagner, Paul-Jurgen; Schanovsky, Franz; Franco, Jacopo; Toledano Luque, Maria; Nelhiebel, M

ISSN

0018-9383

Issue

11

Journal

IEEE Transactions on Electron Devices

Volume

58

Title

The paradigm shift in understanding the bias temperature instability: from reaction–diffusion to switching oxide traps

Publication type

Journal article

Embargo date

9999-12-31