The paradigm shift in understanding the bias temperature instability: from reaction–diffusion to switching oxide traps

Grasser, Tibor; Kaczer, Ben; Goes, Wolfgang; Reisinger, Hans; Aichinger, Thomas; Hehenberger, Phillip; Wagner, Paul-Jurgen; Schanovsky, Franz; Franco, Jacopo; Toledano Luque, Maria; Nelhiebel, M

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The paradigm shift in understanding the bias temperature instability: from reaction–diffusion to switching oxide traps

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2011

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Toledano Luque, Maria

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Nelhiebel, M

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IEEE Transactions on Electron Devices

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The paradigm shift in understanding the bias temperature instability: from reaction–diffusion to switching oxide traps

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