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The paradigm shift in understanding the bias temperature instability: from reaction–diffusion to switching oxide traps
Publication:
The paradigm shift in understanding the bias temperature instability: from reaction–diffusion to switching oxide traps
Date
2011
Journal article
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23751.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Grasser, Tibor
;
Kaczer, Ben
;
Goes, Wolfgang
;
Reisinger, Hans
;
Aichinger, Thomas
;
Hehenberger, Phillip
;
Wagner, Paul-Jurgen
;
Schanovsky, Franz
;
Franco, Jacopo
;
Toledano Luque, Maria
;
Nelhiebel, M
Journal
IEEE Transactions on Electron Devices
Abstract
Description
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1982
since deposited on 2021-10-19
482
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1982
since deposited on 2021-10-19
482
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations