Show simple item record

Analytic modeling of the bias temperature instability using capture/emission time maps

dc.contributor.authorGrasser, Tibor
dc.contributor.authorWagner, Paul-Jurgen
dc.contributor.authorReisinger, Hans
dc.contributor.authorAichinger, T.
dc.contributor.authorPobegen, G.
dc.contributor.authorNelhiebel, M.
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-19T13:57:11Z
dc.date.available2021-10-19T13:57:11Z
dc.date.issued2011-12
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19001
dc.sourceIIOimport
dc.titleAnalytic modeling of the bias temperature instability using capture/emission time maps
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage618
dc.source.endpage621
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate4/12/2011
dc.source.conferencelocationWashington, DC USA
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
23318.pdf
Size:
323.6Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record