OFF-state degradation of high-voltage tolerant nLDMOS-SCR ESD devices

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Authors
Griffoni, Alessio; Chen, Shih-Hung; Thijs, Steven; Kaczer, Ben; Franco, Jacopo; Linten, Dimitri; De Keersgieter, An; Groeseneken, Guido
ISSN
0018-9383
Issue
7
Journal
IEEE Transactions on Electron Devices
Volume
58
Title
OFF-state degradation of high-voltage tolerant nLDMOS-SCR ESD devices
Publication type
Journal article
Embargo date
9999-12-31
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