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Impact of process variability on the radiation-induced soft error rate of decananometer SRAMs in hold and read conditions
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Impact of process variability on the radiation-induced soft error rate of decananometer SRAMs in hold and read conditions
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Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Griffoni, Alessio
;
Zuber, Paul
;
Dobrovolny, Petr
;
Roussel, Philippe
;
Linten, Dimitri
;
Alles, Michael L.
;
Schrimpf, Ronald D.
;
Reed, Robert A.
;
Kobayashi, Daisuke
;
Simoen, Eddy
;
Groeseneken, Guido
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1906
since deposited on 2021-10-19
Acq. date: 2025-12-09
Citations
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Views
1906
since deposited on 2021-10-19
Acq. date: 2025-12-09
Citations